基于氧化物半导体的液门电双层晶体管的静电和电化学性质
Hongtao Yuan1, Hidekazu Shimotani, Jianting Ye
1Quantum Phase Electronics Center and Department of Applied Physics, The University of Tokyo, Tokyo 113-8656, Japan. htyuan@ap.t.u-tokyo.ac.jp
Journal of the American Chemical Society
|December 15, 2010
概括
本研究阐明了液体/固体接口上的电双层 (EDL) 充电机制. 使用霍尔效应和电化学阻抗光谱 (EIS),研究人员在高度缩的EDL接口中区分了静电和电化学充电.
科学领域:
- 材料科学 材料科学 材料科学
- 电化学 电化学 电化学
- 表面科学是一门学科.
背景情况:
- 电气双层 (EDL) 接口由于高电荷积累,在储能和电子等多个领域至关重要.
- 在EDL中区分静电和电化学充电机制仍然是一个挑战.
研究的目的:
- 研究和区分高电荷EDL接口中的充电机制 (静电与电化学).
- 开发一种方法来识别离子液体/氧化物半导体系统中EDL充电的性质.
主要方法:
- 结合电传输测量 (霍尔效应) 与电化学阻抗光谱学 (EIS).
- 利用EIS的温度频率映射来创建用于机制识别的"相图".
主要成果:
- 移动载体的霍尔效应测量与电容-电压集成有很好的相关性,表明载体运输没有伪电容性贡献.
- 开发的EIS温度频率映射有效地区分了对EDL接口的静电和电化学充电,其密度高达8 × 10^14 cm−2.2.
结论:
- 伪电容性在这些高电荷EDL接口中对载体运输没有显著的贡献.
- EIS相位图为在各种EDL接口中区分静电和电化学充电提供了通用方法,指导研究电场诱导的现象.
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