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用X射线衍射分析对单壁,双壁和少壁碳纳米管的宏观壁数分析

Don N Futaba1, Takeo Yamada, Kazufumi Kobashi

  • 1Nanotube Research Center, National Institute of Advanced Industrial Science and Technology, Tsukuba 305-8565, Japan. d-futaba@aist.go.jp

Journal of the American Chemical Society
|March 29, 2011
PubMed
概括

一种新的X射线衍射方法确定了碳纳米管 (CNT) 的平均壁数. 这种宏观技术提供了一种更简单的电子显微镜替代方案,用于分析少壁的CNT.

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