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Updated: May 9, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Published on: May 28, 2016

改进了对电子形状的测量

J J Hudson1, D M Kara, I J Smallman

  • 1Centre for Cold Matter, Blackett Laboratory, Imperial College London, Prince Consort Road, London SW7 2AZ, UK.

Nature
|May 27, 2011
PubMed
概括

科学家们正在寻找电子电二极子时刻 (EDM),这是超越标准模型的新物理学的标志. 实验没有发现电子电流的证据,表明电子具有前所未有的精度是球形的.

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