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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: May 18, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

用原子力显微镜对债券顺序进行区分.

Leo Gross¹, Fabian Mohn, Nikolaj Moll

¹IBM Research-Zurich, CH-8803 Rüschlikon, Switzerland. lgr@zurich.ibm.com

Science (New York, N.Y.)

|September 18, 2012

概括

此摘要是机器生成的。

使用一氧化碳 (CO) 功能化的尖端的高分辨率原子力显微镜 (AFM) 可以在多环芳和富勒伦中区分碳-碳键顺序. 这种技术在AFM图像中透露了通过保利排斥和CO尖端倾斜效应的结合顺序.

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Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

相关实验视频

Last Updated: May 18, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

科学领域:

* 表面科学表面科学
* 化学物理化学物理
* * 材料科学是一门学科.

背景情况:

*多环芳 (PAH) 和富勒伦是具有不同电子性质的关键碳基材料.
* 描述这些分子内的化学键的精确性质对于理解它们的反应性和功能是必不可少的.
*原子力显微镜 (AFM) 提供高分辨率的表面成像,但区分微妙的电子差异,如键序,仍然具有挑战性.

研究的目的:

*为了证明非接触式原子力显微镜 (AFM) 的能力,具有功能化的尖端来区分碳-碳键订单.
* 阐明与结合顺序相关的AFM图像中观察到的对比差异背后的物理机制.
* 用理论计算来验证实验发现.

主要方法:

*非接触式原子力显微镜 (AFM) 使用一氧化碳 (CO) 功能化的尖端.
*对多环芳 (PAH) 和富勒伦的高分辨率成像.
*密度函数理论 (DFT) 计算用于理论验证.

主要成果:

*使用CO功能化的尖端的AFM成像成功地区分了不同的碳-碳键顺序.
*确定了两个对比机制:在较高的债券订单下增加了保利排斥,增强了图像亮度.
*在AFM图像中,由于CO尖顶顶部倾斜,随着结合顺序的增加,明显的结合长度下降.

结论:

*CO功能化的AFM是一种强大的工具,用于在纳米尺度上探测电子结构.
*保利排斥和尖端分子几何学的相互作用决定了AFM对比作用,用于键序差异化.
*这种方法为复杂的碳材料的化学结合提供了新的见解.