定义基于EGaIn的分子道连接点的注入电流和有效电接触面积的值
Felice C Simeone1, Hyo Jae Yoon, Martin M Thuo
1Department of Chemistry and Chemical Biology, Harvard University , Cambridge, Massachusetts 02138, United States.
Journal of the American Chemical Society
|November 6, 2013
概括
我们测量了跨自组装单层 (SAM) 的电荷传输,并确定了注入道的电流密度 (J0). 我们的研究结果显示,J0是10±7.6±0.8 A·cm±-2),对于理解分子电子学和电荷传输至关重要.
科学领域:
- 物理化学 物理化学
- 材料科学 材料科学 材料科学
- 纳米技术 纳米技术
背景情况:
- 通过自组装单层 (SAM) 了解电荷传输对于分子电子学至关重要.
- 以前的研究往往依赖于推断来确定基本的运输参数.
- 精确测量电流密度需要精确计算有效接触区域.
研究的目的:
- 为了准确地确定整个SAM的注射道电流密度 (J0),而无需长度外推.
- 调查表面粗度在确定有效电接触面积方面的作用.
- 评估基于EGaIn的电极对于SAM中的电荷传输研究的适用性.
主要方法:
- 制造Ag ((TS) -SAM//Ga2O3/EGaIn连接器的制造.
- 在不同长度的SAM中测量电流密度 (n=1-18).
- 分析表面粗度以确定有效的电接触面积.
- 计算J0和道瓦解因子 (β).
主要成果:
- 最初的J0估计 (假设几何面积=有效面积) 是10~3.6~0.3 A·cm~-2).
- 详细分析显示,由于粗,有效的电接触面积是几何面积的~10~-4) .
- 校正的J0(+0.5V) =10(7.6±0.8) A·cm(-2),与其他电极材料相一致.
- 道衰变因子β = 0.75 ± 0.02 Å(-1) 属于公认的范围.
结论:
- 基于EGaIn的电极提供了一种可靠的方法来测量跨SAM的电荷传输.
- 准确确定有效接触面积对于量化J0至关重要.
- 该技术适用于对电荷传输现象的物理有机研究.
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