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对固体光辐射中每秒终极状态寿命的直接时间域观测

Zhensheng Tao¹, Cong Chen¹, Tibor Szilvási²

¹Department of Physics and JILA, University of Colorado and NIST, Boulder, CO 80309, USA. zhensheng.tao@jila.colorado.edu cong.chen@colorado.edu.

Science (New York, N.Y.)

|June 4, 2016

概括

当电子进入激发状态时,光电子寿命在中精确地测量,显示了显著的212秒增长. 这种寿命变化与材料的带结构和电子动量密切相关.

科学领域:

固态物理
一秒钟的科学
光电子光谱学

背景情况:

秒光谱可以测量固体中的电子传输动态.
区分光电子与核相对应带的寿命对于理解电子行为至关重要.

研究的目的:

直接测量中的光电子的寿命差异 (111).
研究波段结构如何影响光电子寿命和电子逃逸深度.

主要方法:

使用时秒脉冲列车进行高分辨率的时间测量.
分析光电子发射角度并将它们与带结构和动量相关联.

主要成果:

当最终状态与激发状态相吻合时,观察到光电子寿命增加了212±30阿托秒.
光电子的寿命显示出强烈的角度依赖,与最终状态带分散和横向动量相关.

结论:

材料带结构显著决定了光电子的寿命.
了解这些寿命是确定固体中电子逃逸深度的关键.

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