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相关概念视频

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Electron Configuration of Multielectron Atoms03:26

Electron Configuration of Multielectron Atoms

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The alkali metal sodium (atomic number 11) has one more electron than the neon atom. This electron must go into the lowest-energy subshell available, the 3s orbital, giving a 1s22s22p63s1 configuration. The electrons occupying the outermost shell orbital(s) (highest value of n) are called valence electrons, and those occupying the inner shell orbitals are called core electrons. Since the core electron shells correspond to noble gas electron configurations, we can abbreviate electron...
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Electronic Structure of Atoms02:28

Electronic Structure of Atoms

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An atom comprises protons and neutrons, which are contained inside the dense, central core called the nucleus, with electrons present around the nucleus. Taking into account the wave–particle duality of electrons and the uncertainty in position around the nucleus, quantum mechanics provides a more accurate model for the atomic structure. It describes atomic orbitals as the regions around the nucleus where electrons of discrete energy exist, characterized by four quantum...
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Electron Carriers01:24

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Electron carriers can be thought of as electron shuttles. These compounds can easily accept electrons (i.e., be reduced) or lose them (i.e., be oxidized). They play an essential role in energy production because cellular respiration is contingent on the flow of electrons.
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Electron Affinity03:07

Electron Affinity

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The electron affinity (EA) is the energy change for adding an electron to a gaseous atom to form an anion (negative ion).
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Electron Behavior00:54

Electron Behavior

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Overview
Electrons are negatively charged subatomic particles that are attracted to an orbit around the positively-charged nucleus of an atom. They reside in locations that are associated with energy levels called shells and are further organized into sub-shells and orbitals within each shell.
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这页已由机器翻译。其他页面可能仍然显示为英文。View in English
  1. 首页
  2. 研究领域
  3. 物理科学
  4. 原子,分子和光学物理
  5. 太赫兹物理
  6. 电子束敏感晶体材料的原子分辨率传输电子显微镜
  1. 首页
  2. 研究领域
  3. 物理科学
  4. 原子,分子和光学物理
  5. 太赫兹物理
  6. 电子束敏感晶体材料的原子分辨率传输电子显微镜

相关实验视频

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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电子束敏感晶体材料的原子分辨率传输电子显微镜

Daliang Zhang1, Yihan Zhu2, Lingmei Liu2

  • 1King Abdullah University of Science and Technology (KAUST), Imaging and Characterization Core Lab, Thuwal 23955-6900, Saudi Arabia. daliang.zhang@kaust.edu.sa kun.li@kaust.edu.sa yu.han@kaust.edu.sa.

Science (New York, N.Y.)
|January 20, 2018

在PubMed 上查看摘要

概括
此摘要是机器生成的。

我们开发了高分辨率传输电子显微镜 (TEM) 绘制微妙材料的新方法. 这种技术成功地捕获了电子束敏感的金属有机框架和矿中的原子细节.

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
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科学领域:

  • 材料科学
  • 电子显微镜
  • 纳米技术

背景情况:

  • 用传输电子显微镜 (TEM) 对电子束敏感材料的成像存在重大挑战.
  • 这些挑战包括低光量,快速的晶体区域轴识别,精确的图像对齐和精确的失焦.

研究的目的:

  • 开发和实施一套用于电子束敏感材料的高分辨率TEM成像的方法.
  • 实现金属有机框架 (MOF) 和其他敏感材料的原子分辨率成像.

主要方法:

  • 开发用于低剂量高分辨率TEM成像的专用技术.
  • 实施快速区域轴查找,图像对齐和失焦测量方法.
  • 这些方法应用于各种电子束敏感样本.

主要成果:

  • 成功获得几个金属有机框架 (MOF) 的原子分辨率TEM图像.
  • 在MOF结构中确定了单个金属原子柱,表面终点和环.
  • 将方法的应用扩展到混合矿材料 (CH3NH3PbBr3).

结论:

  • 开发的方法克服了对光束敏感材料的TEM成像的主要挑战.
  • 对于MOF和矿等微妙材料,可以实现原子分辨率成像.
  • 这一进步使敏感纳米材料的细节结构分析成为可能.