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Updated: Jun 15, 2026

High-speed Particle Image Velocimetry Near Surfaces
11:59

High-speed Particle Image Velocimetry Near Surfaces

Published on: June 24, 2013

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微激光器的超快控制

Can Huang1, Chen Zhang1, Shumin Xiao1,2

  • 1State Key Laboratory on Tunable Laser Technology, Ministry of Industry and Information Technology Key Laboratory of Micro-Nano Optoelectronic Information System, Shenzhen Graduate School, Harbin Institute of Technology, Shenzhen 518055, China.

Science (New York, N.Y.)
|February 29, 2020
PubMed
概括

研究人员开发了用于超快光学切换的新型状微激光器. 这些激光器能够在和线性偏光束之间快速,低能量的切换,从而推进光通信和计算技术.

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An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers09:49

An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...