低温聚焦离子束使高度敏感的散体晶体和设备中的局部结构能够进行原子分辨率成像
Jinfei Zhou1, Nini Wei1, Daliang Zhang1
1Multi-scale Porous Materials Center, Institute of Advanced Interdisciplinary Studies & School of Chemistry and Chemical Engineering, Chongqing University, Chongqing 400044, P. R. China.
Journal of the American Chemical Society
|February 14, 2022
概括
低温聚焦离子束 (cryo-FIB) 通过准备高质量的样本,可以对敏感的散装材料进行原子分辨率成像. 这种技术解决了金属有机框架和矿太阳能电池中以前无法获得的复杂结构.
科学领域:
- 材料科学
- 纳米技术
- 电子显微镜
背景情况:
- 敏感材料的原子分辨率成像受限于样本准备的挑战.
- 超低剂量 (扫描) 传输电子显微镜 (S) 提供高分辨率分析,但需要完整的样本.
- 现有的方法难以保护金属有机框架 (MOF) 和矿等散装材料的微妙结构.
研究的目的:
- 引入低温聚焦离子束 (cryo-FIB) 作为电子显微镜敏感散装材料的解决方案.
- 为了证明冷-FIB从具有挑战性的材料中提取高质量的未损坏的薄样本的能力.
- 用 (S) TEM 展示冷-FIB 准备的样本在原子分辨率下揭示复杂的未知局部结构的应用.
主要方法:
- 使用冷却聚焦离子束 (cryo-FIB) 研磨的样本制备.
- 使用 (扫描) 传输电子显微镜 (S) TEM进行高分辨率成像和分析.
- 电子衍射用于结构特征.
主要成果:
- 从金属有机框架 (MOF) 水晶和混合化单晶薄膜中成功提取薄样本,使用冷FIB而不会造成结构损伤.
- 原子分辨率成像揭示了复杂的局部结构,包括MOF HKUST-1中的平面缺陷和MOF UiO-66中的相应阶段.
- 发现一种新的CH3NH3PbI3结构及其在矿太阳能电池中的分布.
结论:
- 低温聚焦离子束 (cryo-FIB) 是一种可行的技术,用于为先进的电子显微镜准备高度敏感的散装材料.
- 这种方法克服了先前在样本制备方面的局限性,扩大了 (S) TEM分析的范围.
- 这项研究强调了冷-FIB在能源和纳米技术等领域推进复杂材料结构的潜力.
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