相关实验视频

Updated: Sep 30, 2025

Visualization of Failure and the Associated Grain-Scale Mechanical Behavior of Granular Soils under Shear using Synchrotron X-Ray Micro-Tomography

Visualization of Failure and the Associated Grain-Scale Mechanical Behavior of Granular Soils under Shear using Synchrotron X-Ray Micro-Tomography

Published on: September 29, 2019

在原子尺度上跟踪谷物边界的滑动

Lihua Wang¹, Yin Zhang², Zhi Zeng²

¹Institute of Microstructure and Property of Advanced Materials, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124, China.

Science (New York, N.Y.)

|March 17, 2022

概括

在中对粒度边界 (GBs) 的变形进行了原子水平的研究. 我们观察到直接滑动或通过断开原子转移的滑动, 揭示了新的变形模式.

科学领域:

材料科学
机械工程
固态物理

背景情况:

粒度边界 (GB) 对多晶材料的机械性能至关重要.
GB变形的原子尺度动力学,特别是一般的不对称的 GB,仍然不太清楚.

研究的目的:

在一般倾斜GB时研究滑动主导变形的原子尺度机制.
阐明断开在GB滑动和原子转移中的作用.

主要方法:

在位原子分辨率显微镜的双晶体在变形.
分析原子运动和结构变化.

主要成果:

观察到两个主要的变形模式:直接的原子级滑动和带有原子转移的滑动.
确定了通过GB平面中介原子转移的断开.
发现了一种结合GB滑动和原子平面转移的新模式.

结论:

在一般倾斜边界的GB滑动涉及直接滑动或合滑动和原子平面转移的过程.
断开连接是促进跨GB原子运输的关键.
提供了对多晶材料GB变形的基本原子尺度理解.

更多相关视频

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries

Published on: April 22, 2013

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

相关概念视频

X-ray Crystallography

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...