在InGaAs中准弹道运输的新分析大信号模型HEMTs适应失位散射
Jinye Wang1, Jun Liu1, Jie Wang1
1Zhejiang Key Laboratory of Large-Scale Integrated Circuit Design, Hangzhou Dianzi University, Hangzhou 310018, China.
Micromachines
|May 27, 2023
概括
一个新的分析模型准确地预测了InGaAs高电子流动性晶体管 (HEMT) 在弹道和准弹道运输下的性能. 它结合了脱位散射,并提供精确的排水电流和电容预测,通过实验数据验证.
科学领域:
- 半导体设备物理 半导体设备物理
- 材料科学 材料科学 材料科学
背景情况:
- 在高频应用中,InGaAs高电子移动性晶体管 (HEMT) 是至关重要的.
- 准确的大信号建模对于设备设计和性能预测至关重要.
- 现有的模型往往缺乏全面的物理效应或广泛的适用性.
研究的目的:
- 为InGaAs HEMTs开发一个基于表面潜力的分析大信号模型.
- 纳入弹道和准弹道运输现象.
- 为了提高准确性,要考虑失位散射和其他物理效应.
主要方法:
- 利用单流法和一种新的传导系数来推导出2D电子气体电荷密度.
- 开发了Ef的统一表达式,用于计算所有门电压区域的表面电位.
- 导出了排水电流,门源电容 (Cgs) 和门排水电容 (Cgd) 的分析表达式.
主要成果:
- 该模型准确地描述了电子气体的电荷密度,表面潜力,排水电流和电容.
- 失位散射被有效地纳入模型.
- 对关键设备参数的分析表达式得到了推导.
结论:
- 开发的分析模型为InGaAs HEMTs提供了准确的大信号预测.
- 该模型与数值模拟和实验数据有很好的一致性.
- 它适用于弹道和准弹道运输制度,增强其实用性.
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