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数字模拟研究在高频正弦电压激发的环氧接口上的粒子缺陷的部分放电

Chen Chen¹, Jian Wang¹, Jingrui Wang¹

¹State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing 102206, China.

|May 27, 2023

概括

本研究引入了一种新的部分放电检测方法,用于使用高频电压的绝缘体中的金属颗粒缺陷. 研究发现,由于电子温度升高和表面电荷密度下降,部分放电在15kHz时最严重.

科学领域:

电气工程电气工程
材料科学材料科学材料科学
等离子体物理学的物理学

背景情况:

部分放电 (PD) 检测对于绝缘体完整性至关重要.
金属颗粒缺陷对绝缘体性能构成重大风险.
对于高频应用,现有的检测方法需要改进.

研究的目的:

提出一种有效的PD检测方法,用于高频正弦电压下的绝缘体中的粒子缺陷.
研究具有粒子缺陷的环氧接口中PD的显微机制和特征.
分析不同频率对PD行为和严重程度的影响.

主要方法:

开发2D等离子体模拟模型,用于具有粒子缺陷的PD.
在板板电极配置下,粒子缺陷PD的动态模拟.
使用放电强度和表面损伤分析对模拟模型进行实验验证.

主要成果:

模拟显示了电子密度,电子温度和表面电荷密度的时空分布.
电压频率的增加导致了更高的电子温度幅度.
表面电荷密度随着频率的增加而下降,PD重度在15kHz时达到峰值.

结论:

拟议的模拟模型准确地捕捉了环氧界面粒子缺陷中的PD特征.
频率显著影响PD行为,15kHz被确定为最严重的情况.
结果为改善PD检测和绝缘设计在高频应力下提供了洞察力.

关键词:

气体固体界面的接口高频正弦形电压高频正弦形电压部分放电模拟模拟器颗粒缺陷颗粒缺陷表面损伤表面损伤

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