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基于SRAM的PUF读取结果

Sergio Vinagrero¹, Honorio Martin², Alice de Bignicourt³

¹Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA, 38000, Grenoble, France. sergio.vinagrero-gutierrez@univ-grenoble-alpes.fr.

Scientific data

|May 27, 2023

概括

这项研究引入了一个新的数据集,用于描述微控制器上的基于SRAM的物理不可克隆功能 (PUF). 该数据集有助于评估硬件安全应用的PUF质量.

科学领域:

硬件安全硬件安全
嵌入式系统工程嵌入式系统工程
集成电路设计集成电路设计

背景情况:

物理非克隆功能 (PUF) 对于硬件根基的信任至关重要.
对PUF进行大规模的表征对于工业采用至关重要,但耗时且昂贵.
现有的PUF表征数据集有限,特别是基于微控制器的解决方案.

研究的目的:

为微控制器上的基于SRAM的PUF提供一个全面的数据集.
促进PUF的质量评估和适合性评估,以确保硬件安全.
为了研究PUF的老化和可靠性特性.

主要方法:

从84个STM32微控制器收集了SRAM读数和内部传感器数据 (电压,温度).
开发了一个定制的,开放的平台,用于自动化数据采集.
设计了平台,以支持对PUF老化和可靠性的实验.

主要成果:

一个新的数据集,包括详细的SRAM读数和84个微控制器的环境参数.
该数据集使基于SRAM的PUF能够进行大规模的参数表征.
数据采集平台的效率和多功能性得到了验证.

结论:

提出的数据集显著减少了PUF表征所需的努力.
本资源支持开发强大的硬件根的信任解决方案.
开放的平台促进了对PUF可靠性和老化的进一步研究.

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