DNA

B O Ma1, Jin-Woo Kim2,3,4, Steve Tung1

  • 1Department of Mechanical Engineering, University of Arkansas, Fayetteville, AR 72701 USA.

IEEE open journal of nanotechnology
|June 7, 2023
PubMed
概括

本研究介绍了一种原子力显微镜 (AFM) 方法,用于精确的DNA转位控制,使DNA在测序过程中能够准确地进行DNA的电特性. 该技术使DNA线性化,使其属性的详细分析更容易.