X线

Walter Giurlani1, Fabio Biffoli2, Lorenzo Fei2

  • 1Department of Chemistry "Ugo Schiff", University of Florence, Via della Lastruccia 3, 50019, Sesto Fiorentino, (FI), Italy; National Interuniversity Consortium of Materials Science and Technology (INSTM), Via G. Giusti 9, 50121, Firenze, (FI), Italy.

PubMed
概括

这项研究引入了一种使用X射线技术测量铜金系统中金属间扩散系数的新方法. 这些发现为薄金涂层提供了准确的扩散数据,这对于材料科学应用至关重要.