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一种基于旋极轴旋转相位移干扰计 (VPAR-PSI) 的高精度测量方法
Zhisong Li1, Jiaxing Sun1, Xiao Xu1
1College of Machine, Shanghai Dianji University, Shanghai, 201306, PR China.
Heliyon
|June 9, 2023
概括
一种新的束极轴旋转相位移干扰计 (VPAR-PSI) 方法提供了更高精度的相位移测量. 与传统方法相比,这种技术可以提高光学元件测量的精度和稳定性.
科学领域:
- 光学和光子学 在光学和光子学.
- 干涉测量是干涉测量的方法.
- 计量学 计量学 计量学
背景情况:
- 传统的相位移干扰测量 (PSI) 方法通常由于灰度调制而存在偏差和非线性.
- 精确的相位转移测量对于高精度计量和光学元件表征至关重要.
研究的目的:
- 引入一种新的相位转移测量技术,即旋流束极轴旋转相位转移干扰测量 (VPAR-PSI),以提高精度.
- 克服传统PSI中灰度调制的局限性.
主要方法:
- 利用束的独特特性,通过极轴旋转直接引入相位移.
- 实施VPAR-PSI进行模拟,采样和对传统PSI进行比较实验.
主要成果:
- 在模拟和实验中,VPAR-PSI在模拟和实验中表现出高的相位转移和解调精度.
- 相对实验显示,与传统PSI相比,VPAR-PSI显著降低了封面值,RMS和标准偏差.
- 观察到平均外缩小1.4202λ,RMS和标准偏差的百分比减少约为59.7%.
结论:
- VPAR-PSI技术为光学元件测量提供了卓越的精度和稳定性.
- VPAR-PSI有效地减轻与灰度调制相关的偏差和非线性.
- 拟议的方法代表了高精度相位移测量的重大进步.
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