扫描探头和像素传感器的同步用于图像导向衍射显微镜
Shahar Seifer1, Michael Elbaum1
1Chemical and Biological Physics, Weizmann Institute of Science, Rehovot, Israel.
HardwareX
|June 9, 2023
概括
本研究介绍了4D-STEM断层扫描的新型同步方法,使得高通量衍射数据的获取成为可能. 开发的系统通过使用超快速探测器精确定时扫描来增强电子显微镜,用于先进材料成像.
科学领域:
- 材料科学 材料科学 材料科学
- 电子显微镜电子显微镜
- 纳米技术纳米技术
背景情况:
- 4D-STEM断层扫描需要精确的电子探头扫描和衍射图像采集之间的同步.
- 超快速探测器可以实现高通量数据收集,但同步仍然是快速倾斜系列采集的挑战.
研究的目的:
- 为4D-STEM断层扫描开发和演示一个强大的同步解决方案.
- 通过使用超快速探测器和先进的扫描技术,实现快速倾斜系列采集.
主要方法:
- 实现了使用微控制器的同步协议,以从扫描发生器时钟中切换触发脉冲.
- 使用SerialEM软件进行图像引导跟踪和自动对焦,并与同时的HAADF成像相结合.
- 采用开源的SavvyScan系统与商业采购卡用于多功能扫描模式.
主要成果:
- 通过使用混合像素探测器 (ARINA,DECTRIS) 成功同步了电子探针扫描与超快速衍射图像采集.
- 证明了该系统在复制格子和费里样本衍射成像上的有效性.
- 通过仅在选定的扫描子区域内记录图像,尽量减少虚假数据.
结论:
- 开发的同步方法对于高通量4D-STEM断层扫描是有效的.
- 这一进步促进了快速倾斜系列的获取,提高了电子显微镜的效率.
- 萨维扫描系统的开源性质和提供的协议促进了更广泛的采用和进一步开发.
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