HfO

Sylwia Gieraltowska1, Lukasz Wachnicki1, Piotr Dluzewski1

  • 1Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, 02-668 Warsaw, Poland.

PubMed
概括

研究了二氧化 (HfO2) 薄膜的原子层沉积 (ALD). 较高的温度提高了薄膜的结晶性和介电性质,氨水增强了介电常数.

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