在GaN表面的费米水平位置对在MAPbI3/GaN接口上的载体转移的影响

Ewelina Zdanowicz1, Artur P Herman1, Łukasz Przypis1,2

  • 1Department of Semiconductor Materials Engineering, Wrocław University of Science and Technology, Wybrzeże Wyspiańskiego 27, Wrocław 50-370, Poland. ewelina.zdanowicz@pwr.edu.pl.

概括

化 (GaN) 和甲基化 (MAPbI3) 接口使用非接触式电反射进行了研究. 结果揭示了载体转移现象,对于开发光电探测器等先进光电子设备至关重要.

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