缺陷的电场操纵和Schottky屏障控制在ZnO纳米线内部
Micah S Haseman1, Hantian Gao1, Kalpak Duddella1
1Department of Physics, The Ohio State University, Columbus, Ohio 43210, United States.
ACS applied materials & interfaces
|June 13, 2023
概括
电场驱动ZnO纳米线中的点缺陷运动,改变电性质并引起不稳定. 这项研究揭示了缺陷迁移机制和一种新的 ZnO 处理技术.
科学领域:
- 材料科学 材料科学 材料科学
- 凝聚物质物理学 凝聚物质物理学
- 纳米技术 纳米技术
背景情况:
- 了解ZnO纳米线中的电传输对于纳米电子应用至关重要.
- 纳米线传输的不稳定性是一个广泛报道的现象.
- 内在点缺陷在设备性能中的作用尚未完全理解.
研究的目的:
- 在电场下的ZnO纳米线中直接测量内在点缺陷的3D运动.
- 为了研究缺陷迁移对金属-ZnO接触行为的影响.
- 为了阐明纳米线传输不稳定的背后的机制.
主要方法:
- 现场阴极光发光光谱 (CLS) 用于绘制缺陷密度的地图.
- 在应用偏差下深度和空间解析的CLS.
- 用于表面分析的X射线光电子光谱 (XPS).
主要成果:
- 应用的电场诱导ZnO接触的可逆转换,使其从调整到欧米.
- 缺陷迁移决定了欧姆和肖特基障碍,解释了运输的不稳定性.
- 电流诱导的热失控驱动缺陷扩散,在接口上积累VO缺陷.
- 在度上缺氧的表面层与VO迁移有关.
结论:
- 内在点缺陷迁移在纳米电场测量中至关重要.
- 缺陷运动系统地控制ZnO纳米线的电阻和稳定性.
- 这项研究提出了一种用于ZnO纳米线精炼和加工的新方法.
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