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在HR-TEM和HR-STEM晶体图像上的应变和位移场的定量映射与虚拟格子的引用

N Cherkashin¹, A Louiset¹, A Chmielewski¹

¹CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, BP 94347, 31055 Toulouse Cedex 4, France.

Ultramicroscopy

|June 17, 2023

概括

一种新的方法,绝对应变 (AbStrain),在电子显微镜图像中量化原子级应变. 它克服了以前技术的局限性,使得复杂材料如铁电异构结构的精确分析成为可能,而不需要参考格子.

科学领域:

材料科学材料科学材料科学
固态物理固态物理
电子显微镜电子显微镜

背景情况:

准确的应变分析对于理解材料特性至关重要.
像几何相位分析这样的现有方法在分析复杂结构方面存在局限性.
高分辨率传输电子显微镜 (HR-TEM) 和HR-STEM提供了原子级成像能力.

研究的目的:

为HR-TEM和HR-STEM图像开发一种新的互惠空间处理方法.
为了能够精确量化和绘制应变组件,平面间距离和角度.
克服现有应变分析技术的局限性,特别是复杂材料.

主要方法:

开发"绝对应变" (AbStrain) 方法用于相互空间分析.
数学形式主义用于纠正HR-TEM和HR-STEM特有的图像扭曲.
介绍了"相对位移"方法,用于分析多原子晶体中的子晶格结构.
将AbStrain和相对位移应用于HR-STEM对铁电异构结构的图像.

主要成果:

AbStrain允许量化和映射平面间距离,角度,位移场和应变张力元件.
AbStrain允许直接分析,而不需要参考格子边缘.
相对位移成功地提取了子格子边缘,并测量了原子柱位移.
对功能性氧化物铁电异构结构的成功应用.

结论:

AbStrain和相对位移为电子显微镜中应变分析提供了先进的功能.
这些方法提供了精确的,经过扭曲校正的原子级应变的测量.
这些技术适用于复杂的晶体材料,包括多原子晶体和异构结构.

关键词:

人权事务高级专员-STEM 高级专员-TEMEM是什么意思移位移位移位移位移位移位移位扭曲的纠正扭曲的纠正图像纠正图像纠正图像纠正两极分化的极化相对移位的相对移位.压力压力压力压力

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