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Updated: Jul 26, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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在探针显微镜中对调叉的剪切力激发模式的定量比较

V V Tkachuk1, J P Korterik1, H L Offerhaus1

  • 1Department of Science and Technology, Optical Sciences Group, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands.

Ultramicroscopy
|June 17, 2023
PubMed
概括

在扫描探针显微镜中比较调叉切削力反的电气和机械激发,这项研究发现,使用传阻强化器的电气激发为稳健的测量提供了最佳性能.

关键词:
在NSOM中,它是NSOM.在SNOM中,SNOM是SNOM.剪切力是指剪切力.调音叉是一个调音叉.

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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