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Updated: Jul 25, 2025

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在电子束粉末床融合过程中使用电子光学成像的现场包含检测和材料特性

Martin Gardfjell1, Marcel Reith1, Martin Franke1

  • 1Neue Materialien Fürth GmbH, 90762 Fürth, Germany.

Materials (Basel, Switzerland)
|June 28, 2023
PubMed
概括

在电子束粉末床融合 (PBF-EB) 中的电子光学成像 (ELO) 可以检测100微米的外来粉末颗粒. ELO还准确地预测合金有效原子数 (Zeff) 用于材料特性.

关键词:
增材制造 增材制造 增材制造背散电子检测 背散电子检测电子束粉末融合床的电子束融合床.电子光学成像技术 电子光学成像技术包含检测检测 包含检测粉尘污染 粉尘污染过程监控 过程监控

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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