memristor:

Jing-Yuan Tsai1, Jui-Yuan Chen2, Chun-Wei Huang3

  • 1Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu, 30010, Taiwan.

概括

高氧化物 (HEO) 在电阻随机存储器 (RRAM) 应用中显示出前景. 这项研究揭示了在RRAM运行过程中HEOs的结构转变,导致了卓越的设备性能.

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