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Updated: Jun 25, 2026

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在内固体密度的Mg X射线激光中对碰撞效应的模拟

Shenyuan Ren1, Sam Vinko1, Justin S Wark1

  • 1Department of Physics, Clarendon Laboratory, University of Oxford, Parks Road, Oxford OX1 3PU, UK.

Philosophical transactions. Series A, Mathematical, physical, and engineering sciences
|July 2, 2023
PubMed
概括

固体密度 (Mg) 中的碰撞效应限制了内部外X射线激光增益持续时间为子femtosecond. 模拟显示线路的扩大和州人口的转移,在大多数过渡中都排除了激光.

关键词:
自由电子激光器的使用.血等离子体是什么?一个X射线激光.

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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