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低侧叶天线的平面近场测量

Michael H Francis¹, Allen C Newell¹, Kenneth R Grimm²

¹National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.

Journal of research of the National Institute of Standards and Technology

|July 5, 2023

概括

平面近场测量技术准确地测量了非常低的侧叶天线,直至-60dB. 探测器-天线相互作用是限制这些先进天线的测量精度的一个关键因素.

科学领域:

电磁学电磁学电磁学电磁学
天线理论天线理论

背景情况:

对于微波天线,平面近场 (PNF) 测量已经确立.
低侧叶天线的进步需要在极端水平上验证PNF准确性.

研究的目的:

评估非常低侧叶天线的平面近场测量技术的准确性.
为了量化侧叶水平的测量精度,降低至-60 dB.

主要方法:

使用开放式波导探头和专门的零场探头进行PNF测量.
应用标准PNF方法与探针校正.
在NIST PNF设施的已知低侧槽波导阵列上进行测量.

主要成果:

PNF测量精确地确定了非常低的侧叶天线的侧叶,低至-55dB至-60dB.
一个零场探头减少了一些不确定性,但增加了探头-天线相互作用的不确定性.
探测器-天线相互作用被确定为测量精度的重要限制因素.

结论:

平面近场技术适用于准确测量非常低的侧叶天线.
尽量减少探头-天线相互作用对于在低侧叶天线的PNF测量中实现更高的准确性至关重要.

关键词:

对天线测量进行测量.农场农场农场农场农场低侧环天线低侧环天线平面的近距离场地.

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