在Si-MOSFETs Terahertz探测器上的非线性校正的微观机制
Yingdong Wei1,2, Chenyu Yao1, Li Han1,3
1State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai 200083, China.
Sensors (Basel, Switzerland)
|July 8, 2023
概括
调查太赫兹 (THz) 探测器显示,优化源剂减少了热电子效应. 这通过平衡非线性校正和光热电效应来提高设备性能.
科学领域:
- 太赫兹 (THz) 是科学和技术的频率.
- 半导体设备物理学 半导体设备物理
- 非线性光学和光电子学.
背景情况:
- 太赫兹 (THz) 探测器对于成像和通信系统至关重要.
- 基于场效应晶体管 (FET) 的THz探测器以灵敏度和成本为优先级.
- 热电子效应显著影响微型THz探测器的性能,其机制尚不清楚.
研究的目的:
- 研究控制THz转化为FETs的微观机制.
- 了解热电子效应和兴奋剂对设备性能的影响.
- 确定优化THz探测器灵敏度和减少有害影响的策略.
主要方法:
- 漂移-扩散/水力动力学模型的实施.
- 运载体动力学使用自相一致的有限元素解决方案.
- 分析器械结构和兴奋剂度依赖性的分析.
主要成果:
- 该研究阐明了非线性校正与热电子诱导的光热电效应之间的相互作用.
- 优化源代谢度被确定为一种减轻热电子效应的方法.
- 设备性能被证明取决于载体动力学和结构.
结论:
- 优化源注是减少THz探测器中热电子效应的关键.
- 这些发现为设计和优化高性能THz设备提供了指导.
- 开发的模型可以应用于其他新型电子系统,用于THz非线性校正研究.
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