与受体移除过程相关的与相关的缺陷,与照射型电子性质的配置转换的辐射p类型的电子性质有关
Andrei Nitescu1, Cristina Besleaga1, George Alexandru Nemnes2,3
1National Institute of Materials Physics, Atomistilor 405A, 077125 Magurele, Ilfov, Romania.
Sensors (Basel, Switzerland)
|July 8, 2023
概括
在添加的辐射诱导的缺陷导致接受器的移除. 这项研究描述了含的供体缺陷 (BCD).
科学领域:
- 半导体物理 半导体物理
- 材料科学 材料科学 材料科学
- 辐射对材料的影响
背景情况:
- 在被辐射的中去除受体是一个关键问题.
- 这种降解与辐射诱导的含供体 (BCD) 缺陷有关.
- 该BCD缺陷表现出影响电气测量的可比性质.
研究的目的:
- 为了研究BCD缺陷在两个配置 (A和B) 的电子特性.
- 为了确定控制这些配置之间的转换的动力学.
- 阐明缺陷转换的机制及其对的影响.
主要方法:
- 电容电压 (CV) 特性在243-308 K的温度范围内进行测量.
- 用热刺激电流 (TSC) 技术测量BCD缺陷度.
- 对耗尽电压变化的分析为缺陷动态提供了洞察力.
主要成果:
- 确定了A→B (0.36 eV) 和B→A (0.94 eV) 转换的能量障碍.
- 转换速率表示电子捕获 (A→B) 和发射 (B→A).
- CV和TSC测量与缺陷度变化与配置转换相关联.
结论:
- 该研究提供了对照射中可视化的BCD缺陷的详细描述.
- 为BCD缺陷转换提出了一个配置坐标图.
- 了解这些缺陷动力学对于减轻设备中的辐射损伤至关重要.
关键词:
在LGAD中,LGAD是LGAD.在 TSC 技术中,使用 TSC 技术.接受器移除 移除 接受器可见的缺陷可见的缺陷用添加的辐射辐射.配置转换的变化 配置转换的变化辐射硬探测器 辐射硬探测器更多相关视频
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