基于Power SiC MOSFET的扩展卡尔曼粒子过器的剩余有用寿命预测
Wei Wu1, Yongqian Gu1, Mingkang Yu1
1School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China.
Micromachines
|July 8, 2023
概括
研究人员开发了一种新方法来预测碳化物金属氧化物半导体场效应晶体管 (SiC MOSFET) 的剩余使用寿命 (RUL). 与传统方法相比,这种扩展卡尔曼粒子波器 (EPF) 方法可提高RUL预测准确率约10%.
科学领域:
- 材料科学 材料科学 材料科学
- 电气工程 电气工程
- 半导体设备物理 半导体设备物理
背景情况:
- 基于的设备正在接近其高功率应用的性能极限.
- 碳化金属氧化物半导体场效应晶体管 (SiC MOSFETs) 是有希望的替代品,但面临着可靠性挑战.
- 关键的可靠性问题包括偏差温度不稳定性,值电压漂移和短路强度降低.
研究的目的:
- 为满足在SiC MOSFET中准确预测剩余使用寿命 (RUL) 的关键需求.
- 为SiC MOSFETs提出和验证一种新的RUL估计方法.
- 提高使用SiC MOSFETs的高功率电子系统的可靠性和操作安全性.
主要方法:
- 开发一个新的功率循环测试平台来监测SiC MOSFET.
- 使用现状电压作为降解监测的前体.
- 基于现状电压降解模型的扩展卡尔曼粒子波器 (EPF) 算法的实现.
主要成果:
- 拟议的EPF方法显著减少了RUL预测错误.
- 使用40%的数据输入,RUL预测误差从20.5% (传统的粒子波器算法 - PF) 降至11.5%的EPF.
- 预测寿命的准确性提高了大约10%.
结论:
- 基于EPF的RUL估计方法为SiC MOSFET提供了更高的准确性.
- 这种方法提高了宽带差功率半导体设备的可靠性评估.
- 这些发现有助于开发更强大,更可预测的高功率电子系统.
相关概念视频
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