一个新的低功耗和软错误恢复 10T SRAM 单元格
Changjun Liu1, Hongxia Liu1, Jianye Yang1
1Key Laboratory for Wide Band Gap Semiconductor Materials and Devices of Education Ministry, School of Microelectronics, Xidian University, Xi'an 710071, China.
Micromachines
|July 8, 2023
概括
本研究介绍了PP10T,这是一种新型的低功耗静态随机存取存储器 (SRAM) 单元,旨在用于软错误恢复. PP10T 细胞表现出强大的数据保留能力和对读取干扰的免疫力,性能优于标准的 6T SRAM 细胞.
科学领域:
- 半导体设备物理学 半导体设备物理
- 集成电路设计 集成电路设计
- 可靠性工程可靠性工程
背景情况:
- 缩小SRAM电池中的晶体管尺寸会降低临界电荷,增加辐射粒子引起的软误差的易感性.
- 当敏感节点受到辐射的影响时,标准6T SRAM单元容易发生数据翻转 (单次事件扰乱).
- 现有的10T SRAM单元设计提供了一些改进,但可能无法完全解决软错误恢复和功耗问题.
研究的目的:
- 提出和评估一种新的低功耗SRAM单元,称为PP10T,专门设计用于增强软错误恢复.
- 为了比较PP10T电池与标准6T和其他10TSRAM电池设计的性能.
- 为了证明PP10T单元在辐射引起的干扰下保持数据完整性的有效性.
主要方法:
- 模拟使用22纳米完全缩在绝缘体 (FDSOI) 工艺进行.
- 建议的PP10T细胞与标准的6T细胞和几个现有的10TSRAM细胞 (Quatro-10T,PS10T,NS10T,RHBD10T) 进行了比较.
- 评估的性能指标包括软错误弹性,读取干扰免疫力和功耗 (持有功率).
主要成果:
- 该PP10T单元显示其敏感节点的完整数据恢复,即使同时发生翻转.
- PP10T对读取干扰具有免疫力,确保读取操作期间的数据完整性.
- 拟议的电池由于减少了泄漏电流,实现了显著较低的承载功率.
结论:
- PP10T SRAM单元为先进的半导体技术中的软误差缓解提供了一个有希望的解决方案.
- 其强大的数据恢复,读取干扰免疫力和低功耗使其适合关键应用.
- 进一步的研究可以探索PP10T在更大的内存阵列中的集成及其在各种操作条件下的性能.
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