高压RC-IGBT内置二极管的低开关损失与缩短的P+发射器
Wei Wu1, Yansong Li1, Mingkang Yu1
1School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China.
Micromachines
|July 8, 2023
概括
一种新型的高压反导绝缘门双极晶体管 (RC-IGBT) 具有缩短的P+发射器,显著降低了内置二极管中的切换损失. 这种设计改进使逆回收损失降低了20%,而不会影响IGBT的性能.
科学领域:
- 电力电子 电力电子 电力电子
- 半导体设备 半导体设备
- 材料科学 材料科学 材料科学
背景情况:
- 高压反导隔热门双极晶体管 (RC-IGBT) 对于电源切换应用至关重要.
- 尽量减少开关损失,特别是在集成二极管的逆回收过程中,是一个关键的挑战.
- 现有的RC-IGBT设计经常面临二极管性能和IGBT特性之间的权衡.
研究的目的:
- 提出一种具有低开关损失内置二极管的新型RC-IGBT设计.
- 为了在不降低绝缘门双极晶体管 (IGBT) 性能的情况下降低反向回收损失.
- 确保制造与现有工艺的兼容性.
主要方法:
- 在RC-IGBT的二极管部分引入一个缩短的P+发射器 (SE).
- 在逆回收过程中对孔注射效率和载体提取的分析.
- 使用设备模拟来量化性能改进.
- 与传统的RC-IGBT进行比较分析.
主要成果:
- 缩短的P+发射器有效地抑制了孔注射效率.
- 在逆回收过程中减少载体提取导致较低的峰值逆回收电流.
- 模拟显示,内置二极管的逆回收损失减少了20%.
- P+发射器的独立设计可以防止IGBT特征的退化.
结论:
- 在RC-IGBT的二极管部分提出的SE可显著降低开关损失.
- 该设计保持或提高了RC-IGBT的整体性能.
- 制造过程与传统的RC-IGBT几乎完全相同,这有助于工业采用.
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