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Updated: Jul 24, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

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提高晶体识别准确度的互动深度探测器系统与峰值到电荷歧视方法

Kento Miyata1, Ryo Ogawara2, Masayori Ishikawa3

  • 1Graduate School of Biomedical Science and Engineering, Hokkaido University, N-15 W-7 Kita-ku, Sapporo 060-8638, Japan.

Sensors (Basel, Switzerland)
|July 11, 2023
PubMed
概括

这项研究开发了用于正电子发射断层扫描 (PET) 的峰值到电荷歧视 (PQD) 探测器系统,以减少抛物误差. 该系统有效地区分了闪器层,提高了PET成像中的空间分辨率.

关键词:
数据采集 (DAQ) 的方法相互作用的深度 (DOI)现场可编程门阵列 (FPGA)位置敏感的光倍增管 (PS-PMT) 是一个脉冲形状歧视 (PSD) 是指脉冲形状的区别.小动物正子发射断层扫描 (PET)

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