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Lei Dong1, Bin Wang1, Hongzhuang Li1
1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China.
一个新的剪切干扰检测系统通过克服天窗干扰,显著增强白天光学检测昏暗的物体. 与传统方法相比,这种新系统表现出卓越的性能和更高的图像信号噪声比率.
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