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Updated: Jul 21, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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在小距离的3D像素传感器中,TCAD分析了泄漏电流和故障电压

Jixing Ye1,2, Abderrezak Boughedda1,3, D M S Sultan2

  • 1Dipartimento di Ingegneria Industriale, Università degli Studi di Trento, 38123 Trento, Italy.

Sensors (Basel, Switzerland)
|July 11, 2023
PubMed
概括

高亮度LHC的小距离3D像素传感器具有辐射硬度和高效率. TCAD模拟研究故障电压和泄漏电流,以优化传感器设计适应极端条件.

关键词:
3D像素传感器 3D像素传感器这是一个TCAD模拟.断裂电压的故障电压是什么

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