在低融材料的激光光束接中用于温度测定的双色热谱
Karen Schwarzkopf1,2, Richard Rothfelder1,2, Michael Rasch1
1Institute of Photonic Technologies, Friedrich-Alexander-Universität Erlangen-Nürnberg, Konrad-Zuse-Str. 3/5, 91052 Erlangen, Germany.
Sensors (Basel, Switzerland)
|July 11, 2023
概括
这项研究引入了一种基于比率的新型两色温度学系统,用于在激光束接过程中精确地实时测量低融材料的温度. 该系统准确地捕捉温度动态,克服现有方法的局限性.
科学领域:
- 材料科学与工程 材料科学与工程
- 光学测量技术的使用
- 制造过程 制造过程 制造过程
背景情况:
- 精确的温度监测对于像这样的低合金的激光束接至关重要.
- 现有的方法,如火量计和温度计,在空间分辨率,辐射率知识或温度范围方面存在局限性.
研究的目的:
- 开发和验证基于比率的双色色温谱系统,用于空间和时间分辨率的温度测量 (<1200 K).
- 在不同的工艺参数下,评估系统在商业激光束接设置中的性能.
主要方法:
- 实现基于比率的双色色温谱系统.
- 在恒定热辐射的物体上进行校准和测试,并考虑到发射率的变化.
- 集成到激光束接设置中,用于动态温度分析.
主要成果:
- 开发的系统准确地确定了低化范围 (<1200 K) 的温度,尽管信号强度和发射率的波动.
- 在激光束接设置中的成功应用证明了测量动态温度行为的能力.
结论:
- 基于比率的双色温谱为合金激光束接中的先进温度监测提供了可行的解决方案.
- 来自内部反射的图像工件目前限制了其用于动态温度演变分析的直接应用.
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