粗细两阶段校准方法,以提高反向有限元素方法的精度
Jiewei Lu1,2, Dahang He1, Zhenyi Zhao1
1Key Laboratory of Electronic Equipment Structure Design, Ministry of Education, Xidian University, Xi'an 710071, China.
Sensors (Basel, Switzerland)
|July 14, 2023
概括
本研究引入了一种两阶段校准方法,以提高结构位移重建的逆有限元方法 (iFEM) 的准确性. 新方法通过优化传感器放置和完善训练数据选择来提高精度.
科学领域:
- 结构力学的结构力学.
- 计算工程是指计算机工程.
- 计量学 计量学 计量学
背景情况:
- 逆有限元法 (iFEM) 允许从离散应变测量进行全场位移重建.
- 由于传感器位置偏移和安装错误,iFEM的实际应用面临准确性限制.
研究的目的:
- 提出和验证粗细两阶段校准 (CFTSC) 方法,以提高iFEM的准确性.
- 为了解决传感器安装的不准确性,并优化结构重建.
主要方法:
- 一个粗的校准阶段使用单个目标粒子群优化 (SOPSO) 算法来改进位移-菌株转换矩阵.
- 精细校准阶段使用残余分析来选择自建模糊网络 (SCFN) 的最佳训练数据.
主要成果:
- 在重建结构位移场时,CFTSC方法表现出更高的准确性.
- 在翼集成天线结构上的实验验证证证了该方法的有效性.
结论:
- 拟议的CFTSC方法显著提高了iFEM用于结构位移重建的准确性.
- 这种方法为具有安装不确定性的真实世界工程应用提供了强大的解决方案.
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