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对于Fabry-Perot多孔成像光谱仪的干扰仪响应表征算法

Daniele Picone, Silvère Gousset, Mauro Dalla Mura

|July 21, 2023

概括

我们开发了一种新的算法,即干扰仪响应表征算法 (IRCA),用于校准超光谱成像设备. 这种方法准确地描述了Fabry-Perot干扰仪的传输率响应,以改善光谱成像.

科学领域:

光学和光子学在光学和光子学.
频谱学是一种光谱学.
图像处理图像处理

背景情况:

超光谱成像设备对捕获详细的光谱信息有很高的需求.
干涉测谱光谱成像系统,特别是使用光圈分割的系统,提供紧的快照获取功能.
这些系统需要精确的校准才能获得准确的性能.

研究的目的:

介绍一个强大的算法来表征多孔径成像光谱仪的传输率响应.
为这些设备提出一个精细的图像形成模型,考虑到不同的精致模式.
在实验原型上验证开发的表征算法.

主要方法:

干扰仪响应表征算法 (IRCA) 是一个三步程序.
它描述了基于Fabry-Perot的多孔径成像光谱仪的传导率响应.
该算法使用单色光源和非线性回归来估计参数.

主要成果:

IRCA算法成功地描述了干扰仪的响应.
拟议的图像形成模型适用于不同细度级别的参数估计.
在四个Image SPectrometer On Chip (ImSPOC) 原型上进行实验验证,证实了算法的性能.

结论:

IRCA提供了一种可靠的方法,用于校准干扰度超谱成像系统.
开发的图像形成模型提高了参数估计的准确性.
这项工作有助于可靠地部署紧的快照超光谱成像设备.

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