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相关概念视频

Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
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Transmission Electron Microscopy01:15

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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Atomic Force Microscopy01:08

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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The probe is regarded as the heart of any AFM setup and comprises the...
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Scanning Electron Microscopy01:07

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Overview of Electron Microscopy01:25

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Overview of Microscopy Techniques01:22

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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相关实验视频

Updated: Jul 22, 2025

Imaging Replicative Domains in Ultrastructurally Preserved Chromatin by Electron Tomography
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在原子分辨率中交错扫描传输电子显微镜

Jonathan J P Peters1,2, Tiarnan Mullarkey1,2,3, James A Gott4,5

  • 1Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College Dublin, Dublin D02 DA31, Ireland.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 25, 2023
PubMed
概括

这项研究引入了用于扫描传输电子显微镜的交织成像方法. 这种技术可以实现更快的率,最小的图像质量损失和卓越的应变精度,即使使用现有的硬件.

关键词:
高率的STEM可以使用.交织在一起的交织.扫描传输电子显微镜扫描传输电子显微镜紧张精度精确度 紧张精度

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科学领域:

  • 材料科学 材料科学 材料科学
  • 显微镜的使用方法
  • 物理 物理学 物理

背景情况:

  • 扫描传输电子显微镜 (STEM) 对于剂量控制,现场实验和减少扫描扭曲等应用,需要快速的率.
  • 目前增加率的方法往往会损害图像质量或需要昂贵的硬件升级.

研究的目的:

  • 提出一种交织成像方法,以提高STEM框架速率.
  • 为了证明图像质量损失最小,采集速度更快.
  • 与其他方法相比,以显示改进的应变精度.

主要方法:

  • 在现有扫描控制器上实施交织成像策略.
  • 在增加率时评估图像质量.
  • 在不同电子剂量和成像技术下比较应变精度.

主要成果:

  • 交错成像方法成功地增加了率,对图像质量的影响最小.
  • 这种方法与许多现有的扫描电子显微镜控制器兼容.
  • 交错技术为给定的电子剂量提供了最高的应变精度.

结论:

  • 交错成像是实现高速STEM的有效和可访问的方法.
  • 这种方法平衡了率增强与图像保真.
  • 它代表了在现场研究和STEM中精确测量的重大进步.