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Updated: Jul 21, 2025

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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通过XPS对非球形核心外纳米颗粒的理论表征方法

J M Gong1,2,3, M S S Khan4, B Da2

  • 1Department of Physics, University of Science and Technology of China, Hefei, Anhui 230026, P. R. China. zjding@ustc.edu.cn.

Physical chemistry chemical physics : PCCP
|July 26, 2023
PubMed
概括

这项研究扩展了Shard公式,使用蒙特卡洛模拟来准确测量非球形核心外纳米粒子的外厚度. 新公式将复杂纳米粒子形状的预测误差降低到10%以下.

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