背面照明的光辐射电子显微镜 (BIPEEM)
Amin Moradi1, Matthijs Rog1, Guido Stam1
1Leiden Institute of Physics, Niels Bohrweg2, Leiden, the Netherlands.
Ultramicroscopy
|August 6, 2023
概括
一种新的技术,背光发射电子显微镜 (BIPEEM),图像样本厚度和内部结构. 这种方法补充了传统的PEEM,通过从后面照亮样品.
科学领域:
- 表面科学是一门学科.
- 显微镜技术 显微镜技术
- 材料的特性 材料的特性
背景情况:
- 光辐射电子显微镜 (PEEM) 是一种对表面敏感的技术.
- 现有的PEEM方法主要探测样品表面.
研究的目的:
- 介绍和描述一个新的PEEM变体:背光PEEM (BIPEEM).
- 为了证明BIPEEM能够对表面和内部样本信息进行成像的能力.
主要方法:
- 开发一个背面照明PEEM (BIPEEM) 的设置.
- 将样品放置在透明基板上,用于背面照明.
- 从前面收集从前面发出的电子.
主要成果:
- BIPEEM图像表现出强烈的厚度依赖.
- 建立了一个将电子强度与光学衰减长度和电子平均自由路径相关联的模型.
- 实验展示了BIPEEM能够捕获内部和表面信息的能力.
结论:
- BIPEEM提供了对传统PEEM的补充洞察力.
- 该技术为PEEM中深度分辨率成像提供了一种方法.
- BIPEEM扩大了电子显微镜用于材料分析的应用范围.
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