用CITIUS充电整合探测器进行布拉格连贯衍射成像
Michael Grimes1,2, Kristof Pauwels2, Tobias U Schülli2
1Université Grenoble Alpes, CEA Grenoble, IRIG, MEM, NRS, 17 rue des Martyrs, F-38000 Grenoble, France.
概括
新的高速X射线成像仪CITIUS探测器显著加速了布拉格连贯衍射成像. 它实现了与光子计数探测器相似的分辨率,但是在很短的时间内.
科学领域:
- 在X射线成像中使用X射线成像.
- 衍射成像技术的成像
- 材料科学是一种材料科学.
背景情况:
- 高速X射线成像对于先进的材料分析至关重要.
- 布拉格连贯衍射成像 (BCDI) 需要具有高动态范围和速度的探测器.
- 现有的探测器在采集速度和数据吞吐量方面面临限制.
研究的目的:
- 为了评估CITIUS探测器在BCDI应用中的性能.
- 将CITIUS探测器与BCDI现有的光子计数探测器进行比较.
- 评估CITIUS在动态BCDI测量方面的潜力.
主要方法:
- 在欧洲同步仪极其明亮源 (ESRF-EBS) 中使用了CITIUS探测器.
- 在纳米级材料上进行BCDI实验.
- 与光子计数探测器比较空间分辨率和采集时间.
主要成果:
- CITIUS探测器实现了20 ± 6nm的空间分辨率,相当于光子计数探测器 (22 ± 9nm).
- 使用CITIUS,获取时间从200秒大幅缩短到23秒.
- 在高率 (17.4 kHz) 和高和度计数率 (>30 Mcps/像素) 上显示一致的线性响应.
结论:
- 该CITIUS探测器为BCDI提供了显著的进步,使得更快,更有效的成像.
- 它的高速和线性响应使其适合动态BCDI实验.
- 建议进一步优化以提高其用于先进连贯成像技术的能力.
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