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使用ToF-SIMS扩大指纹增强的效率

Deborah Charlton1,2, Catia Costa3, Steven J Hinder4

  • 1Department of Chemistry, University of Surrey, Guildford GU2 7XH, Surrey, UK.

Molecules (Basel, Switzerland)
|August 12, 2023
PubMed
概括

飞行时间二次离子质谱 (ToF-SIMS) 改善了在常见表面上的指纹恢复. 使用正离子和负离子模式都可增强指纹脊细节的可视化,即使经过长时间的老化.

关键词:
这就是SIMS SIMS.他们的指纹是指纹.指纹指纹指纹指纹指纹指纹二次离子质谱仪二次离子质谱仪

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