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Updated: Jul 19, 2025

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评估氧等离子聚焦离子束 (O-PFIB) 蚀刻在聚烯表面的质量,使用二次电子高光谱成像

Nicholas T H Farr1,2, Maciej Pasniewski3,4, Alex de Marco5,6

  • 1Department of Materials Science and Engineering, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, Sheffield S1 3JD, UK.

Polymers
|August 12, 2023
PubMed
概括

聚焦离子束扫描电子显微镜 (FIB-SEM) 推进了聚合物分析. 这项研究使用二次电子高光谱成像 (SEHI) 揭示聚合物上的离子表面相互作用,增强FIB-SEM的表征.

关键词:
聚焦的离子束聚焦的离子束.聚合物表征的聚合物表征在聚合物加工加工过程中.二次电子光谱学二次电子光谱学表面相互作用的表面相互作用.

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