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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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相关实验视频

Updated: Jul 18, 2025

Quantitative Hardness Measurement by Instrumented AFM-indentation
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Quantitative Hardness Measurement by Instrumented AFM-indentation

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通过AFM敲击而不会造成表面损伤的形态测量:一个相位转移特性.

Yang He1, Yongda Yan2, Yanquan Geng2

  • 1Shenzhen Key Laboratory of Cross-scale Manufacturing Mechanics, Southern University of Science and Technology, Shenzhen 518055, China; SUSTech Institute for Manufacturing Innovation, Southern University of Science and Technology, Shenzhen 518055, China; Department of Mechanics and Aerospace Engineering, Southern University of Science and Technology, Shenzhen 518055, China; The State Key Laboratory of Robotics and Systems, Robotics Institute, Harbin Institute of Technology, Harbin 150001, China; Center for Precision Engineering, Harbin Institute of Technology, Harbin 150001, China.

Ultramicroscopy
|August 24, 2023
PubMed
概括
此摘要是机器生成的。

原子力显微镜 (AFM) 敲击模式中的相位转移表明尖端-表面相互作用. 这项研究表明,相位变化是非破坏性表面形态测量的敏感指标,可以区分损伤和无损伤扫描.

关键词:
航空飞行管理 (AFM)阶段转移的阶段转移.聚合物的聚合物.表面损伤造成的损伤.触摸模式 触摸模式

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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

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相关实验视频

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Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
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科学领域:

  • 表面科学是一门科学.
  • 材料的表征材料的表征.
  • 纳米技术纳米技术

背景情况:

  • 原子力显微镜 (AFM) 对于表面形态测量至关重要.
  • 确保使用AFM进行无损测量是一个重大挑战.
  • 在AFM点击模式中的尖端表面相互作用需要进一步了解.

研究的目的:

  • 调查相位移作为AFM中尖端表面相互作用的特征信号.
  • 探索相位移和非破坏性表面形态测量之间的关系.
  • 为了确定从非破坏性到破坏性AFM扫描过渡的门.

主要方法:

  • 使用触摸模式的原子力显微镜 (AFM) 在聚甲酸薄膜上.
  • 分析相位转移变化与驱动振幅和尖端半径的变化.
  • 在扫描过程中量化尖端表面能量消耗.
  • 观察表面形态变化和塑性变形.

主要成果:

  • 当驱动幅度翻倍时,相位转移从0.47°增加到1.85°,与可观察到的纹相关.
  • 尖端半径为15-20纳米 (能量消耗10-35 eV),没有发生显著的相位转移,这表明非破坏性相互作用.
  • 在55nm的尖端半径下,观察到0.02-0.64°的相位移 (能量消耗60-110 eV),微小的塑性变形.
  • 在重复点击模式扫描下,更软的表面表现出更高的相位移.

结论:

  • 阶段转移是AFM触摸模式期间尖端表面相互作用的敏感指标.
  • 阶段转移有效地区分了非破坏性和破坏性表面形态测量.
  • 了解相位转移是优化AFM参数以实现准确且无损表面分析的关键.