Scanning Electron Microscopy
Computed Tomography
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Jonas Fell1, Felix Wetzler1, Michael Maisl2
1Lightweight Systems, Department of Materials Science, Campus E3 1, Saarland University, 66123 Saarbrücken, Germany.
研究人员通过设计各种X射线目标来优化纳米计算机断层扫描 (纳米CT). 不同的目标几何形状提高了各种材料表征应用的图像质量,提高了纳米CT的性能.
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