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穿孔缺陷对爆炸薄膜传感器的电爆炸性质的影响

Kexuan Wang¹, Jiangxu Wang^2,3, Xinyu Li²

¹Shaanxi Applied Physics and Chemistry Research Institute, Xi'an 710061, China.

|August 26, 2023

概括

表面缺陷显著影响金属爆炸性薄膜传感器. 即使是微小的缺陷也会提前电爆时间,并降低传导效率,这凸显了对无缺陷片的需求.

科学领域:

材料科学材料科学材料科学
电气工程电气工程
物理物理学物理

背景情况:

金属爆炸转换器是各种应用中的关键组件.
这些传感器的性能对材料特性和结构完整性敏感.
桥上的表面缺陷可以改变它们的电爆炸性行为.

研究的目的:

为了研究表面缺陷对金属爆炸性薄膜传感器的电爆性能的影响.
分析桥梁薄膜的缺陷如何影响电爆炸时间和转导效率.
量化由特定缺陷大小引起的性能下降.

主要方法:

为缺陷的桥梁薄膜开发电流电压模拟模型.
通过实验电流电压测量验证模拟结果.
对有缺陷和无缺陷的铜进行比较分析.

主要成果:

穿孔缺陷提前电气爆炸时间,降低传导效率.
一个半径为20微米的缺陷使爆炸时间延长了1 ns,效率降低了1.52%.
一个半径50微米的缺陷使爆炸时间提前51 ns,效率降低13.96%.

结论:

表面缺陷对薄膜传感器的电爆炸性质有不利影响.
尽量减少表面缺陷对于提高这些设备的性能和可靠性至关重要.
该研究提供了关于缺陷引起的性能下降的定量数据.

关键词:

爆炸时间爆炸时间金属桥梁片金属片穿透孔的缺陷穿透孔的缺陷传感器的效率效率转换器的效率

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