无序的基于ZnO的薄膜晶体管的下值导电
1Department of Physics and Institute of Quantum Convergence Technology, Kangwon National University, Chuncheon 24341, Republic of Korea.
Micromachines
|August 26, 2023
概括
氧化薄膜晶体管 (ZnO TFTs) 的失调会降低由于局部陷状态而导致的下值摆动. 这项研究模拟了这些效应,揭示了影响性能的门依赖参数.
科学领域:
- 材料科学 材料科学 材料科学
- 半导体物理 半导体物理
- 设备工程 设备工程
背景情况:
- 原子沉积的 ZnO 薄膜晶体管 (TFT) 具有 n 型增强模式特征.
- 观察到下值摆动退化,并与无序半导体中的局部陷状态有关.
研究的目的:
- 为了研究混乱对ZnO TFTs的子值特征的影响.
- 为了建模下值电流电压和失序因素之间的关系.
主要方法:
- 通过对无序半导体的网关依赖功率定律来推导子值电流-电压关系.
- 分析接口陷电容和电子扩散系数作为关键的混乱因素.
- 取决于温度的电流电压分析,以了解传导机制.
主要成果:
- 在无序的半导体中获得了一个门依赖功率定律模型,用于下值电流电压.
- 障碍参数已成功推导出并与现有方法进行验证.
- 界面陷被确定为限制小值导电,导致扩散电流.
结论:
- 在ZnO薄膜中的失序显著影响下值波动,导致无法定义的特征.
- 局部陷状态,接口电容和电子扩散是影响ZnO TFT性能的关键因素.
- 衍生模型提供了对无序半导体器件中电荷传输的洞察.
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