X线

Yingjun Chai1, Chaoyan Jiang2, Xudong Hu1

  • 1MIIT Key Laboratory of Advanced Display Material and Devices, School of Material Science and Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China.

概括

研究人员开发了一种新方法来制造高质量的矿厚膜,用于X射线检测. 这种技术提高了膜的紧性,减少了缺陷,为先进的X射线成像设备铺平了道路.

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