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Updated: Jul 17, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on: September 28, 2016

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气相中SiC的单光子电离:SiC的实验性和初始的表征

B Gans1, J Liévin2, P Halvick3

  • 1Institut des Sciences Moléculaires d'Orsay, CNRS, Université Paris-Saclay, F-91405 Orsay, France. berenger.gans@universite-paris-saclay.fr.

Physical chemistry chemical physics : PCCP
|September 1, 2023
PubMed
概括

这项研究为碳化 (SiC) 基的单光子电离过渡提供了第一个实验观测. 研究人员确定了关键的电离能,为了解这个具有挑战性的分子提供了关键数据.

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics11:33

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The molecular ion peak of a molecule in the mass spectrum provides vital information for molecular identification. However, conventional electron impact ionization can lead to the rapid dissociation of some molecular ions before they reach the detector. A milder ionization method is required to increase the lifetime of such ionized analyte molecules. Chemical ionization (CI) is a gas-phase protonation reaction useful for mass-analyzing analyte molecules that are easily protonated to yield the...
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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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