在CVD培养的MoS2场效应晶体管中治疗捐赠者缺陷状态,使用带有通道保护屏障的氧气等离子体
Inseong Lee1, Mingu Kang1, Seohak Park1
1Graphene/2D Materials Research Center, School of Electrical Engineering, Graduate School of Semiconductor Technology, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, 34141, Republic of Korea.
Small (Weinheim an der Bergstrasse, Germany)
|September 5, 2023
概括
氧气等离子治疗有效地治愈了二硫化物 (MoS) 晶体管中的硫空缺. 这种缺陷修复提高了设备性能,改善了下一代电子产品的电流和移动性.
科学领域:
- 材料科学 材料科学 材料科学
- 凝聚物质物理学 凝聚物质物理学
- 纳米技术 纳米技术
背景情况:
- 二硫化物 (MoS) 是先进晶体管的关键材料.
- 在MoS2中的硫空缺 (Vs) 会导致不必要的n-doping,降低性能.
- 有效的缺陷管理对于可扩展的二维电子产品至关重要.
研究的目的:
- 开发一种方法来治愈单层MoS2中的供体缺陷状态.
- 为了研究氧等离子体治疗对MoS2通道特性的影响.
- 为了提高基于MoS2的晶体管的电性能.
主要方法:
- 使用氧气等离子治疗用氧化 (Al2O3) 屏障层.
- 采用X射线光电子光谱,光发光和拉曼光谱进行缺陷分析.
- 电气特性包括电流,移动性和载体度.
主要成果:
- 在MoS2中使用氧等离子体成功治愈硫空缺,并通过光谱学确认.
- 观察到二维板载体度的下降 (Δn2D = -3.82×1012 cm-2). 在这种情况下,
- 取得了显著的改进:电流量增加了18%,移动性增加了44%.
- 在5.7×1012cm-2的金属绝缘器过渡中证明了更好的通道质量.
- 在所有门电压 (VG) 中减少激活能量 (Ea).
结论:
- 在二维材料中的缺陷的等离子体辅助治愈是可行的.
- 使用Al2O3屏障进行氧气等离子体处理,可以提高MoS2晶体管的性能.
- 这种方法为开发高性能下一代电子设备提供了一条途径.
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